High-resolution detection of quantitative trait loci for seven important yield-related traits in wheat (Triticum aestivum L.) using a high-density SLAF-seq genetic map

High-resolution detection of quantitative trait loci for seven important yield-related traits in wheat (Triticum aestivum L.) using a high-density SLAF-seq genetic map

Abstract Background Yield-related traits including thousand grain weight (TGW), grain number per spike (GNS), grain width (GW), grain length (GL), plant height (PH), spike length (SL), and spikelet number per spike (SNS) are greatly associated with grain yield of wheat (Triticum aestivum L.). To det...

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Bibliographic Details
Main Authors: Tao Li, Qiao Li, Jinhui Wang, Zhao Yang, Yanyan Tang, Yan Su, Juanyu Zhang, Xvebing Qiu, Xi Pu, Zhifen Pan, Haili Zhang, Junjun Liang, Zehou Liu, Jun Li, Wuyun Yan, Maoqun Yu, Hai Long, Yuming Wei, Guangbing Deng
Format: Article
Language:English
Published: BMC 2022-05-01
Series:BMC Genomic Data
Subjects:
Wheat
Yield
Yield-related traits
Specific-locus amplified fragment (SLAF)
Linkage analysis
Online Access:https://doi.org/10.1186/s12863-022-01050-0

Internet

https://doi.org/10.1186/s12863-022-01050-0

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