Synthesis of Pt nanoparticles and their burrowing into Si due to synergistic effects of ion beam energy losses

Synthesis of Pt nanoparticles and their burrowing into Si due to synergistic effects of ion beam energy losses

We report the synthesis of Pt nanoparticles and their burrowing into silicon upon irradiation of a Pt–Si thin film with medium-energy neon ions at constant fluence (1.0 × 1017 ions/cm2). Several values of medium-energy neon ions were chosen in order to vary the ratio of the electronic energy loss to...

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Bibliographic Details
Main Authors: Pravin Kumar, Udai Bhan Singh, Kedar Mal, Sunil Ojha, Indra Sulania, Dinakar Kanjilal, Dinesh Singh, Vidya Nand Singh
Format: Article
Language:English
Published: Beilstein-Institut 2014-10-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
burrowing of nanoparticles
medium-energy ion irradiation
nuclear and electronic energy loss
Rutherford backscattering spectroscopy
scanning electron microscopy
thin films
transmission electron microscopy
Online Access:https://doi.org/10.3762/bjnano.5.197

Internet

https://doi.org/10.3762/bjnano.5.197

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