Product of mobility and lifetime of charge carriers in CdTe determined from low-frequency current fluctuations

Abstract The model, which clarifies the low-frequency fluctuations of the current flowing in CdTe sample, makes it possible to determine the product of the mobility and lifetime of the charges in mentioned semiconductor. This model, with general validity for semiconductors, is based on the interacti...

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Bibliographic Details
Main Authors: J. Toušek, J. Toušková, I. Křivka
Format: Article
Language:English
Published: Nature Portfolio 2024-01-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-024-51541-6