Voltage drop across Josephson junctions for Lévy noise detection

We propose to characterize Lévy-distributed stochastic fluctuations through the measurement of the average voltage drop across a current-biased Josephson junction. We show that the noise induced switching process in the Josephson washboard potential can be exploited to reveal and characterize Lévy f...

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Bibliographic Details
Main Authors: Claudio Guarcello, Giovanni Filatrella, Bernardo Spagnolo, Vincenzo Pierro, Davide Valenti
Format: Article
Language:English
Published: American Physical Society 2020-12-01
Series:Physical Review Research
Online Access:http://doi.org/10.1103/PhysRevResearch.2.043332