Analysis of thermal-offset drift of a high-resolution current probe using a planar Hall resistance sensor

<p>We developed a pin-type current probe with high sensitivity, targeting electrical-probing printed circuit boards (PCBs). The developed sensor showed good enough characteristics, with 1 mA resolution on current measurements and up to 1 MHz operating frequency for analyzing highly integrated...

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Bibliographic Details
Main Authors: N. Lee, J. Kim, D. Lee
Format: Article
Language:English
Published: Copernicus Publications 2023-08-01
Series:Journal of Sensors and Sensor Systems
Online Access:https://jsss.copernicus.org/articles/12/225/2023/jsss-12-225-2023.pdf