Efficient fault-tolerant implementation of imprecision tolerant applications in nano scale error-prone VLSI technologies: A case study on fuzzy hardware
Emerging nano-level technologies provide very high device densities that facilitate high performance implementation of more complex applications. However, they also introduce new challenging reliability issues such as appearance of transient faults and concurrent occurrence of multiple faults in the...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2020-04-01
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Series: | Engineering Science and Technology, an International Journal |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2215098618322195 |