Efficient fault-tolerant implementation of imprecision tolerant applications in nano scale error-prone VLSI technologies: A case study on fuzzy hardware

Emerging nano-level technologies provide very high device densities that facilitate high performance implementation of more complex applications. However, they also introduce new challenging reliability issues such as appearance of transient faults and concurrent occurrence of multiple faults in the...

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Bibliographic Details
Main Authors: Hamid Reza Mahdiani, Mohammad Haji Seyed Javadi
Format: Article
Language:English
Published: Elsevier 2020-04-01
Series:Engineering Science and Technology, an International Journal
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2215098618322195

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