Low-cost electron detector for scanning electron microscope
Electron microscopy is an indispensable tool for the characterization of (nano) materials. Electron microscopes are typically very expensive and their internal operation is often shielded from the user. This situation can provide fast and high quality results for researchers focusing on e.g. materia...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2023-06-01
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| Series: | HardwareX |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2468067223000202 |