Low-cost electron detector for scanning electron microscope
Electron microscopy is an indispensable tool for the characterization of (nano) materials. Electron microscopes are typically very expensive and their internal operation is often shielded from the user. This situation can provide fast and high quality results for researchers focusing on e.g. materia...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2023-06-01
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| Series: | HardwareX |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2468067223000202 |
| _version_ | 1797796372309606400 |
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| author | Evgenii Vlasov Nikita Denisov Johan Verbeeck |
| author_facet | Evgenii Vlasov Nikita Denisov Johan Verbeeck |
| author_sort | Evgenii Vlasov |
| collection | DOAJ |
| description | Electron microscopy is an indispensable tool for the characterization of (nano) materials. Electron microscopes are typically very expensive and their internal operation is often shielded from the user. This situation can provide fast and high quality results for researchers focusing on e.g. materials science if they have access to the relevant instruments. For researchers focusing on technique development, wishing to test novel setups, however, the high entry price can lead to risk aversion and deter researchers from innovating electron microscopy technology further. The closed attitude of commercial entities about how exactly the different parts of electron microscopes work, makes it even harder for newcomers in this field. Here we propose an affordable, easy-to-build electron detector for use in a scanning electron microscope (SEM). The aim of this project is to shed light on the functioning of such detectors as well as show that even a very modest design can lead to acceptable performance while providing high flexibility for experimentation and customization. |
| first_indexed | 2024-03-13T03:32:05Z |
| format | Article |
| id | doaj.art-18f608f3fcc1455c95465e5a37420cd3 |
| institution | Directory Open Access Journal |
| issn | 2468-0672 |
| language | English |
| last_indexed | 2024-03-13T03:32:05Z |
| publishDate | 2023-06-01 |
| publisher | Elsevier |
| record_format | Article |
| series | HardwareX |
| spelling | doaj.art-18f608f3fcc1455c95465e5a37420cd32023-06-24T05:18:15ZengElsevierHardwareX2468-06722023-06-0114e00413Low-cost electron detector for scanning electron microscopeEvgenii Vlasov0Nikita Denisov1Johan Verbeeck2Electron Microscopy for Materials Science, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, BelgiumElectron Microscopy for Materials Science, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, BelgiumCorresponding author.; Electron Microscopy for Materials Science, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, BelgiumElectron microscopy is an indispensable tool for the characterization of (nano) materials. Electron microscopes are typically very expensive and their internal operation is often shielded from the user. This situation can provide fast and high quality results for researchers focusing on e.g. materials science if they have access to the relevant instruments. For researchers focusing on technique development, wishing to test novel setups, however, the high entry price can lead to risk aversion and deter researchers from innovating electron microscopy technology further. The closed attitude of commercial entities about how exactly the different parts of electron microscopes work, makes it even harder for newcomers in this field. Here we propose an affordable, easy-to-build electron detector for use in a scanning electron microscope (SEM). The aim of this project is to shed light on the functioning of such detectors as well as show that even a very modest design can lead to acceptable performance while providing high flexibility for experimentation and customization.http://www.sciencedirect.com/science/article/pii/S2468067223000202Electron detectionScanning electron microscopyOpen-source |
| spellingShingle | Evgenii Vlasov Nikita Denisov Johan Verbeeck Low-cost electron detector for scanning electron microscope HardwareX Electron detection Scanning electron microscopy Open-source |
| title | Low-cost electron detector for scanning electron microscope |
| title_full | Low-cost electron detector for scanning electron microscope |
| title_fullStr | Low-cost electron detector for scanning electron microscope |
| title_full_unstemmed | Low-cost electron detector for scanning electron microscope |
| title_short | Low-cost electron detector for scanning electron microscope |
| title_sort | low cost electron detector for scanning electron microscope |
| topic | Electron detection Scanning electron microscopy Open-source |
| url | http://www.sciencedirect.com/science/article/pii/S2468067223000202 |
| work_keys_str_mv | AT evgeniivlasov lowcostelectrondetectorforscanningelectronmicroscope AT nikitadenisov lowcostelectrondetectorforscanningelectronmicroscope AT johanverbeeck lowcostelectrondetectorforscanningelectronmicroscope |