Spectral confocal reflection microscopy using a white light source

We present a reflection confocal microscope incorporating a white light supercontinuum source and spectral detection. The microscope provides images resolved spatially in three-dimensions, in addition to spectral resolution covering the wavelength range 450-650 nm. Images and reflection spectra of a...

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Bibliographic Details
Main Authors: Booth Martin J., Juškaitis Rimas, Wilson Tony
Format: Article
Language:English
Published: EDP Sciences 2008-01-01
Series:Journal of the European Optical Society-Rapid Publications
Subjects:
Online Access:https://jeos.edpsciences.org/articles/jeos/pdf/2008/01/jeos20080308026.pdf