Spectral confocal reflection microscopy using a white light source
We present a reflection confocal microscope incorporating a white light supercontinuum source and spectral detection. The microscope provides images resolved spatially in three-dimensions, in addition to spectral resolution covering the wavelength range 450-650 nm. Images and reflection spectra of a...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
EDP Sciences
2008-01-01
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Series: | Journal of the European Optical Society-Rapid Publications |
Subjects: | |
Online Access: | https://jeos.edpsciences.org/articles/jeos/pdf/2008/01/jeos20080308026.pdf |