Van der Waals interfaces in multilayer junctions for ultraviolet photodetection

Abstract Developments in semiconductor science have led to the miniaturization and improvement of light detection technologies for many applications. However, traditional pn-junctions or three-dimensional device geometries for detection of ultraviolet (UV) light are still limited by the physical pro...

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Bibliographic Details
Main Authors: Shihong Xie, Mustaqeem Shiffa, Mujahid Shiffa, Zakhar R. Kudrynskyi, Oleg Makarovskiy, Zakhar D. Kovalyuk, Wenkai Zhu, Kaiyou Wang, Amalia Patanè
Format: Article
Language:English
Published: Nature Portfolio 2022-09-01
Series:npj 2D Materials and Applications
Online Access:https://doi.org/10.1038/s41699-022-00338-0