Single event upset reinforcement technology of DICE flip-flop based on layout design
D flip-flop is the basis of timing logic circuit, and SEMU phenomenon tends to be serious with the integrated circuit process size shrinking to nanometer scale. The anti-SEU ability based on DICE structure for D flip-flop cannot meet the requirements of aerospace engineering. Based on the SEU reinfo...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | zho |
| Published: |
EDP Sciences
2022-12-01
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| Series: | Xibei Gongye Daxue Xuebao |
| Subjects: | |
| Online Access: | https://www.jnwpu.org/articles/jnwpu/full_html/2022/06/jnwpu2022406p1305/jnwpu2022406p1305.html |