Guidelines for establishing an etching procedure for dislocation density measurements on multicrystalline silicon samples
With multicrystalline silicon becoming the main material used for photovoltaic applications and dislocations being one of the main material limitations to better solar cell efficiency, etch pit density measurements are gaining more importance. Traditionally, etch pit density measurements are based o...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2018-01-01
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| Series: | MethodsX |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2215016118301559 |