A Novel Symmetrical Peak Fitting Method Based on Improved WOA Algorithm for the Analysis of Microchip Electrophoresis Signals

The problem of overlapping peaks has been a challenge in microchip electrophoresis (ME) signal analysis. However, traditional peak fitting algorithms have difficulty analyzing overlapping peaks due to the high dependence on the starting point. In this study, we propose a symmetrical peak fitting met...

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Bibliographic Details
Main Authors: Wenhe He, Jianjiao Wang, Yaping Liu, Zhipeng Qin, Cuimin Sun, Hui You, Xiangfu Wei, Ying Liu
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Symmetry
Subjects:
Online Access:https://www.mdpi.com/2073-8994/14/12/2603