Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination
In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated by the photodiode as well as the resulting mechan...
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Format: | Article |
Language: | English |
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Beilstein-Institut
2023-11-01
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Series: | Beilstein Journal of Nanotechnology |
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Online Access: | https://doi.org/10.3762/bjnano.14.87 |
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author | Zeinab Eftekhari Nasim Rezaei Hidde Stokkel Jian-Yao Zheng Andrea Cerreta Ilka Hermes Minh Nguyen Guus Rijnders Rebecca Saive |
author_facet | Zeinab Eftekhari Nasim Rezaei Hidde Stokkel Jian-Yao Zheng Andrea Cerreta Ilka Hermes Minh Nguyen Guus Rijnders Rebecca Saive |
author_sort | Zeinab Eftekhari |
collection | DOAJ |
description | In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated by the photodiode as well as the resulting mechanical oscillation of the piezoelectric membrane with vertical atomic resolution in real-time. This technique offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale. Furthermore, time-dependent atomic force microscopy (AFM) was employed to spatially map voltage-induced oscillation of various sizes of piezoelectric membranes without the photodiode to investigate their position- and size-dependent displacement. |
first_indexed | 2024-03-09T03:03:36Z |
format | Article |
id | doaj.art-1ab30092194d4d219a10aa9d53ffea99 |
institution | Directory Open Access Journal |
issn | 2190-4286 |
language | English |
last_indexed | 2024-03-09T03:03:36Z |
publishDate | 2023-11-01 |
publisher | Beilstein-Institut |
record_format | Article |
series | Beilstein Journal of Nanotechnology |
spelling | doaj.art-1ab30092194d4d219a10aa9d53ffea992023-12-04T09:04:49ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862023-11-011411059106710.3762/bjnano.14.872190-4286-14-87Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illuminationZeinab Eftekhari0Nasim Rezaei1Hidde Stokkel2Jian-Yao Zheng3Andrea Cerreta4Ilka Hermes5Minh Nguyen6Guus Rijnders7Rebecca Saive8Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Park Systems Europe GmbH, 68199 Mannheim, GermanyPark Systems Europe GmbH, 68199 Mannheim, GermanyInorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated by the photodiode as well as the resulting mechanical oscillation of the piezoelectric membrane with vertical atomic resolution in real-time. This technique offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale. Furthermore, time-dependent atomic force microscopy (AFM) was employed to spatially map voltage-induced oscillation of various sizes of piezoelectric membranes without the photodiode to investigate their position- and size-dependent displacement.https://doi.org/10.3762/bjnano.14.87kelvin probe force microscopy (kpfm)light-driven micro/nano systemspiezoelectric membranesurface photovoltage (spv)time-dependent afm |
spellingShingle | Zeinab Eftekhari Nasim Rezaei Hidde Stokkel Jian-Yao Zheng Andrea Cerreta Ilka Hermes Minh Nguyen Guus Rijnders Rebecca Saive Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination Beilstein Journal of Nanotechnology kelvin probe force microscopy (kpfm) light-driven micro/nano systems piezoelectric membrane surface photovoltage (spv) time-dependent afm |
title | Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination |
title_full | Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination |
title_fullStr | Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination |
title_full_unstemmed | Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination |
title_short | Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination |
title_sort | spatial mapping of photovoltage and light induced displacement of on chip coupled piezo photodiodes by kelvin probe force microscopy under modulated illumination |
topic | kelvin probe force microscopy (kpfm) light-driven micro/nano systems piezoelectric membrane surface photovoltage (spv) time-dependent afm |
url | https://doi.org/10.3762/bjnano.14.87 |
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