Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated by the photodiode as well as the resulting mechan...

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Main Authors: Zeinab Eftekhari, Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Andrea Cerreta, Ilka Hermes, Minh Nguyen, Guus Rijnders, Rebecca Saive
Format: Article
Language:English
Published: Beilstein-Institut 2023-11-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.14.87
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author Zeinab Eftekhari
Nasim Rezaei
Hidde Stokkel
Jian-Yao Zheng
Andrea Cerreta
Ilka Hermes
Minh Nguyen
Guus Rijnders
Rebecca Saive
author_facet Zeinab Eftekhari
Nasim Rezaei
Hidde Stokkel
Jian-Yao Zheng
Andrea Cerreta
Ilka Hermes
Minh Nguyen
Guus Rijnders
Rebecca Saive
author_sort Zeinab Eftekhari
collection DOAJ
description In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated by the photodiode as well as the resulting mechanical oscillation of the piezoelectric membrane with vertical atomic resolution in real-time. This technique offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale. Furthermore, time-dependent atomic force microscopy (AFM) was employed to spatially map voltage-induced oscillation of various sizes of piezoelectric membranes without the photodiode to investigate their position- and size-dependent displacement.
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spelling doaj.art-1ab30092194d4d219a10aa9d53ffea992023-12-04T09:04:49ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862023-11-011411059106710.3762/bjnano.14.872190-4286-14-87Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illuminationZeinab Eftekhari0Nasim Rezaei1Hidde Stokkel2Jian-Yao Zheng3Andrea Cerreta4Ilka Hermes5Minh Nguyen6Guus Rijnders7Rebecca Saive8Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Park Systems Europe GmbH, 68199 Mannheim, GermanyPark Systems Europe GmbH, 68199 Mannheim, GermanyInorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated by the photodiode as well as the resulting mechanical oscillation of the piezoelectric membrane with vertical atomic resolution in real-time. This technique offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale. Furthermore, time-dependent atomic force microscopy (AFM) was employed to spatially map voltage-induced oscillation of various sizes of piezoelectric membranes without the photodiode to investigate their position- and size-dependent displacement.https://doi.org/10.3762/bjnano.14.87kelvin probe force microscopy (kpfm)light-driven micro/nano systemspiezoelectric membranesurface photovoltage (spv)time-dependent afm
spellingShingle Zeinab Eftekhari
Nasim Rezaei
Hidde Stokkel
Jian-Yao Zheng
Andrea Cerreta
Ilka Hermes
Minh Nguyen
Guus Rijnders
Rebecca Saive
Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination
Beilstein Journal of Nanotechnology
kelvin probe force microscopy (kpfm)
light-driven micro/nano systems
piezoelectric membrane
surface photovoltage (spv)
time-dependent afm
title Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination
title_full Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination
title_fullStr Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination
title_full_unstemmed Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination
title_short Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination
title_sort spatial mapping of photovoltage and light induced displacement of on chip coupled piezo photodiodes by kelvin probe force microscopy under modulated illumination
topic kelvin probe force microscopy (kpfm)
light-driven micro/nano systems
piezoelectric membrane
surface photovoltage (spv)
time-dependent afm
url https://doi.org/10.3762/bjnano.14.87
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