APA (7th ed.) Citation

Liu, D., Wang, W., Zhang, J., Ren, Q., Fan, L., Wang, Y., . . . Zhang, M. (2023). A Universal Method for Extracting and Quantitatively Analyzing Bias‐Dependent Contact Resistance in Carbon‐Nanotube Thin‐Film Transistors. Wiley-VCH.

Chicago Style (17th ed.) Citation

Liu, Dexing, Wanting Wang, Jiaona Zhang, Qinqi Ren, Lingchong Fan, Yarong Wang, Yiming Zhang, and Min Zhang. A Universal Method for Extracting and Quantitatively Analyzing Bias‐Dependent Contact Resistance in Carbon‐Nanotube Thin‐Film Transistors. Wiley-VCH, 2023.

MLA (9th ed.) Citation

Liu, Dexing, et al. A Universal Method for Extracting and Quantitatively Analyzing Bias‐Dependent Contact Resistance in Carbon‐Nanotube Thin‐Film Transistors. Wiley-VCH, 2023.