An Investigation into the Comprehensive Impact of Self-Heating and Hot Carrier Injection
As the device feature size shrinks, the dissipation of power increases and further raises the carrier and lattice temperature, which finally affects device performance. In this paper, we analyze the comprehensive influence of the self-heating effect and hot carrier injection (HCI) using TCAD simulat...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-09-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/11/17/2753 |