An Investigation into the Comprehensive Impact of Self-Heating and Hot Carrier Injection

As the device feature size shrinks, the dissipation of power increases and further raises the carrier and lattice temperature, which finally affects device performance. In this paper, we analyze the comprehensive influence of the self-heating effect and hot carrier injection (HCI) using TCAD simulat...

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Bibliographic Details
Main Authors: Yan Liu, Yanhua Ma, Zhaojie Yu, Shanshan Lou, Yang Qu, Yuchun Chang
Format: Article
Language:English
Published: MDPI AG 2022-09-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/11/17/2753

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