Temperature Dependence of Electrical Resistance in Ge-Sb-Te Thin Films

Nowadays, the Ge-Sb-Te system is studied extensively for use in the field of both electrical and optical non-volatile memories. The key of this application is based on the changes in the physical properties (electrical conductivity or refractive index) of these films as a result of structural transf...

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Bibliographic Details
Main Authors: Javier Rocca, Jose Luis García, María Andrea Ureña, Marcelo Fontana, Bibiana Arcondo
Format: Article
Language:English
Published: Associação Brasileira de Metalurgia e Materiais (ABM); Associação Brasileira de Cerâmica (ABC); Associação Brasileira de Polímeros (ABPol) 2019-02-01
Series:Materials Research
Subjects:
Online Access:http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392019000200231&tlng=en