Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging

Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging

In this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are ev...

Volledige beschrijving

Bibliografische gegevens
Hoofdauteurs: Abdollah Pil-Ali, Sahar Adnani, Christopher C. Scott, Karim S. Karim
Formaat: Artikel
Taal:English
Gepubliceerd in: MDPI AG 2022-08-01
Reeks:Sensors
Onderwerpen:
X-ray phase-contrast imaging
propagation-based
edge-illumination
coded-aperture
direct conversion detector
amorphous selenium
Online toegang:https://www.mdpi.com/1424-8220/22/15/5890

Internet

https://www.mdpi.com/1424-8220/22/15/5890

Gelijkaardige items