Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging

Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging

In this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are ev...

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Bibliographic Details
Main Authors: Abdollah Pil-Ali, Sahar Adnani, Christopher C. Scott, Karim S. Karim
Format: Article
Language:English
Published: MDPI AG 2022-08-01
Series:Sensors
Subjects:
X-ray phase-contrast imaging
propagation-based
edge-illumination
coded-aperture
direct conversion detector
amorphous selenium
Online Access:https://www.mdpi.com/1424-8220/22/15/5890

Internet

https://www.mdpi.com/1424-8220/22/15/5890

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