Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging
In this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are ev...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-08-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/22/15/5890 |
| _version_ | 1797412143711125504 |
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| author | Abdollah Pil-Ali Sahar Adnani Christopher C. Scott Karim S. Karim |
| author_facet | Abdollah Pil-Ali Sahar Adnani Christopher C. Scott Karim S. Karim |
| author_sort | Abdollah Pil-Ali |
| collection | DOAJ |
| description | In this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are evaluated through a wave optics model—numerically simulated in MATLAB—and are compared based on their contrast, edge-enhancement, visibility, and dose efficiency characteristics. The EI-XPCi configuration, in general, demonstrates higher performance compared to PB-XPCi, considering a setup with the same X-ray source and detector. However, absorption masks quality (thickness of X-ray absorption material) and environmental vibration effect are two potential challenges for EI-XPCi employing a detector with micron-scale pixels. Simulation results confirm that the behavior of an EI-XPCi system employing a high-resolution detector is susceptible to its absorption masks thickness and misalignment. This work demonstrates the potential and feasibility of employing a high-resolution direct conversion detector for phase-contrast imaging applications where higher dose efficiency, higher contrast images, and a more compact imaging system are of interest. |
| first_indexed | 2024-03-09T04:58:47Z |
| format | Article |
| id | doaj.art-1b0f13fc3c76477c82db2152a307e643 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-09T04:58:47Z |
| publishDate | 2022-08-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-1b0f13fc3c76477c82db2152a307e6432023-12-03T13:02:27ZengMDPI AGSensors1424-82202022-08-012215589010.3390/s22155890Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast ImagingAbdollah Pil-Ali0Sahar Adnani1Christopher C. Scott2Karim S. Karim3Department of Electrical and Computer Engineering, University of Waterloo, 200 University Ave W, Waterloo, ON N2L 3G1, CanadaDepartment of Electrical and Computer Engineering, University of Waterloo, 200 University Ave W, Waterloo, ON N2L 3G1, CanadaKA Imaging, 560 Parkside Dr #3, Waterloo, ON N2L 5Z4, CanadaDepartment of Electrical and Computer Engineering, University of Waterloo, 200 University Ave W, Waterloo, ON N2L 3G1, CanadaIn this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are evaluated through a wave optics model—numerically simulated in MATLAB—and are compared based on their contrast, edge-enhancement, visibility, and dose efficiency characteristics. The EI-XPCi configuration, in general, demonstrates higher performance compared to PB-XPCi, considering a setup with the same X-ray source and detector. However, absorption masks quality (thickness of X-ray absorption material) and environmental vibration effect are two potential challenges for EI-XPCi employing a detector with micron-scale pixels. Simulation results confirm that the behavior of an EI-XPCi system employing a high-resolution detector is susceptible to its absorption masks thickness and misalignment. This work demonstrates the potential and feasibility of employing a high-resolution direct conversion detector for phase-contrast imaging applications where higher dose efficiency, higher contrast images, and a more compact imaging system are of interest.https://www.mdpi.com/1424-8220/22/15/5890X-ray phase-contrast imagingpropagation-basededge-illuminationcoded-aperturedirect conversion detectoramorphous selenium |
| spellingShingle | Abdollah Pil-Ali Sahar Adnani Christopher C. Scott Karim S. Karim Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging Sensors X-ray phase-contrast imaging propagation-based edge-illumination coded-aperture direct conversion detector amorphous selenium |
| title | Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging |
| title_full | Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging |
| title_fullStr | Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging |
| title_full_unstemmed | Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging |
| title_short | Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging |
| title_sort | direct conversion x ray detector with micron scale pixel pitch for edge illumination and propagation based x ray phase contrast imaging |
| topic | X-ray phase-contrast imaging propagation-based edge-illumination coded-aperture direct conversion detector amorphous selenium |
| url | https://www.mdpi.com/1424-8220/22/15/5890 |
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