Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging
In this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are ev...
Main Authors: | Abdollah Pil-Ali, Sahar Adnani, Christopher C. Scott, Karim S. Karim |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-08-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/22/15/5890 |
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