Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110), respectively, were thoroughly studied. The conta...

Deskribapen osoa

Xehetasun bibliografikoak
Egile Nagusiak: Thomas König, Georg H. Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde
Formatua: Artikulua
Hizkuntza:English
Argitaratua: Beilstein-Institut 2011-01-01
Saila:Beilstein Journal of Nanotechnology
Gaiak:
aluminum oxide
charge state
contact potential
defects
domain boundaries
dynamic force microscopy
frequency modulation atomic force microscopy
Kelvin probe force microscopy
magnesium oxide
non-contact atomic force microscopy
scanning tunneling microscopy
thin films
work function
Sarrera elektronikoa:https://doi.org/10.3762/bjnano.2.1

Internet

https://doi.org/10.3762/bjnano.2.1

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