Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110), respectively, were thoroughly studied. The conta...

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Bibliographic Details
Main Authors: Thomas König, Georg H. Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde
Format: Article
Language:English
Published: Beilstein-Institut 2011-01-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.2.1