Optical diffraction applied to electron microscopy. A model of diffractometer and image processing unit.

The analysis of images obtained in the electron microscope is made mostly through subjective mechanisms, using the observers experience to recognize morphologic patterns which will allow the identification of the structures. The development of techniques allowing a quantitative evaluation of certai...

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Bibliographic Details
Main Authors: F. Carvalho Rodrigues, J. F. Moura Nunes, J. Oliveira Soares
Format: Article
Language:English
Published: Ordem dos Médicos 1979-08-01
Series:Acta Médica Portuguesa
Online Access:https://www.actamedicaportuguesa.com/revista/index.php/amp/article/view/4384