Enhanced FIB-SEM systems for large-volume 3D imaging
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can automatically generate 3D images with superior z-axis resolution, yielding data that needs minimal image registration and related post-processing. Obstacles blocking wider adoption of FIB-SEM include slow imaging speed and lack of long-term...
Main Authors: | , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
eLife Sciences Publications Ltd
2017-05-01
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Series: | eLife |
Subjects: | |
Online Access: | https://elifesciences.org/articles/25916 |