Optimal test plans for accelerated life tests based on progressive type-I censoring with engineering applications
In reliability engineering studies, the accelerated life tests with optimal test design that balances cost constraints is particularly important since the lifetimes of electro-mechanical, electronic, and mechanical goods are typically modelled with this characteristic. Comparative optimal test plans...
| Päätekijät: | , , , , |
|---|---|
| Aineistotyyppi: | Artikkeli |
| Kieli: | English |
| Julkaistu: |
Elsevier
2024-01-01
|
| Sarja: | Alexandria Engineering Journal |
| Aiheet: | |
| Linkit: | http://www.sciencedirect.com/science/article/pii/S1110016823011304 |