Molecular mapping of leaf rust resistance gene LrL224 in Chinese wheat cultivar L224-3

Molecular mapping of leaf rust resistance gene LrL224 in Chinese wheat cultivar L224-3

Leaf rust, caused by Puccinia triticina, is a major wheat disease worldwide. The chinese wheat cultivar L224-3 showed high resistance to most of P. triticina pathotypes in the seedling and adult stage. Identifying and mapping the leaf rust resistance gene(s) in L224-3 is very useful for breeding lea...

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Bibliographic Details
Main Authors: Yue ZHOU, Huan LI, Pei-Pei ZHANG, Lin WANG, Zai-Feng LI
Format: Article
Language:English
Published: Czech Academy of Agricultural Sciences 2018-06-01
Series:Czech Journal of Genetics and Plant Breeding
Subjects:
genetic analysis
molecular marker
puccinia triticina
wheat (triticum aestivum l.)
Online Access:https://cjgpb.agriculturejournals.cz/artkey/cjg-201802-0004_molecular-mapping-of-leaf-rust-resistance-gene-lrl224-in-chinese-wheat-cultivar-l224-3.php

Internet

https://cjgpb.agriculturejournals.cz/artkey/cjg-201802-0004_molecular-mapping-of-leaf-rust-resistance-gene-lrl224-in-chinese-wheat-cultivar-l224-3.php

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