Accurate Estimation without Calibration of the Complex Relative Permittivity of Multilayer Dielectric Material based on the Finite Integration Technique

In this paper, a simple and effective solution is proposed to accurately estimate the complex relative permittivity of individual layers and multilayers of dielectric material samples from the S-parameters measured by two waveguide cells having equal or different lengths filled with the same vacuum/...

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Bibliographic Details
Main Authors: Manh-Cuong Ho, Trong-Hieu Le
Format: Article
Language:English
Published: D. G. Pylarinos 2023-06-01
Series:Engineering, Technology & Applied Science Research
Subjects:
Online Access:https://etasr.com/index.php/ETASR/article/view/5665