Developing a best practice for sample preparation of additive manufactured AlSi10Mg for electron backscatter diffraction analysis

Developing a best practice for sample preparation of additive manufactured AlSi10Mg for electron backscatter diffraction analysis

Microstructural characterization has a key role in analyzing the properties of additive manufactured materials. Electron backscatter diffraction (EBSD) can offer a unique set of information on the microstructural state of these materials. However, EBSD analyses is extremely sensitive to the quality...

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Bibliographic Details
Main Authors: Erfan Maleki, Sara Bagherifard, Ludovica Rovatti, Rasheed Michael Ishola, Manoj Revuru, Mario Guagliano
Format: Article
Language:English
Published: Elsevier 2023-04-01
Series:Additive Manufacturing Letters
Subjects:
Additive manufacturing
AlSi10Mg, electron backscatter diffraction (EBSD)
Microstructural characterization
Qualification
Online Access:http://www.sciencedirect.com/science/article/pii/S2772369023000038

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http://www.sciencedirect.com/science/article/pii/S2772369023000038

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