Developing a best practice for sample preparation of additive manufactured AlSi10Mg for electron backscatter diffraction analysis
Microstructural characterization has a key role in analyzing the properties of additive manufactured materials. Electron backscatter diffraction (EBSD) can offer a unique set of information on the microstructural state of these materials. However, EBSD analyses is extremely sensitive to the quality...
Main Authors: | Erfan Maleki, Sara Bagherifard, Ludovica Rovatti, Rasheed Michael Ishola, Manoj Revuru, Mario Guagliano |
---|---|
Format: | Article |
Language: | English |
Published: |
Elsevier
2023-04-01
|
Series: | Additive Manufacturing Letters |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2772369023000038 |
Similar Items
-
Correlation of residual stress, hardness and surface roughness with crack initiation and fatigue strength of surface treated additive manufactured AlSi10Mg: Experimental and machine learning approaches
by: Erfan Maleki, et al.
Published: (2023-05-01) -
Fatigue performance of U-notched additively manufactured AlSi10Mg parts: The effects of chemical and thermal post-treatments
by: Erfan Maleki, et al.
Published: (2023-12-01) -
Residual stresses in additively manufactured AlSi10Mg: Raman spectroscopy and X-ray diffraction analysis
by: Silvia Marola, et al.
Published: (2021-04-01) -
Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?
by: Annalena Wolff
Published: (2021-08-01) -
Pulsed current-voltage electrodeposition of stoichiometric Bi2Te3 nanowires and their crystallographic characterization by transmission electron backscatter diffraction
by: Cristina V. Manzano, et al.
Published: (2019-12-01)