A BIST Scheme for Bootstrapped Switches
This paper proposes a built-in self-test (BIST) scheme for detecting catastrophic faults in bootstrapped switches. The clock signal and the gate voltage of the sampling MOS transistor are taken as the observation signals in the proposed BIST scheme. Usually, the gate voltage of the sampling MOS tran...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-07-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/10/14/1661 |