Evaluation of serial crystallographic structure determination within megahertz pulse trains

Evaluation of serial crystallographic structure determination within megahertz pulse trains

The new European X-ray Free-Electron Laser (European XFEL) is the first X-ray free-electron laser capable of delivering intense X-ray pulses with a megahertz interpulse spacing in a wavelength range suitable for atomic resolution structure determination. An outstanding but crucial question is whethe...

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Main Authors: Oleksandr Yefanov, Dominik Oberthür, Richard Bean, Max O. Wiedorn, Juraj Knoska, Gisel Pena, Salah Awel, Lars Gumprecht, Martin Domaracky, Iosifina Sarrou, P. Lourdu Xavier, Markus Metz, Saša Bajt, Valerio Mariani, Yaroslav Gevorkov, Thomas A. White, Aleksandra Tolstikova, Pablo Villanueva-Perez, Carolin Seuring, Steve Aplin, Armando D. Estillore, Jochen Küpper, Alexander Klyuev, Manuela Kuhn, Torsten Laurus, Heinz Graafsma, Diana C. F. Monteiro, Martin Trebbin, Filipe R. N. C. Maia, Francisco Cruz-Mazo, Alfonso M. Gañán-Calvo, Michael Heymann, Connie Darmanin, Brian Abbey, Marius Schmidt, Petra Fromme, Klaus Giewekemeyer, Marcin Sikorski, Rita Graceffa, Patrik Vagovic, Thomas Kluyver, Martin Bergemann, Hans Fangohr, Jolanta Sztuk-Dambietz, Steffen Hauf, Natascha Raab, Valerii Bondar, Adrian P. Mancuso, Henry Chapman, Anton Barty
格式: Article
語言:English
出版: AIP Publishing LLC and ACA 2019-11-01
叢編:Structural Dynamics
在線閱讀:http://dx.doi.org/10.1063/1.5124387

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http://dx.doi.org/10.1063/1.5124387

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