Multiscale Investigation of the Structural, Electrical and Photoluminescence Properties of MoS<sub>2</sub> Obtained by MoO<sub>3</sub> Sulfurization

Multiscale Investigation of the Structural, Electrical and Photoluminescence Properties of MoS<sub>2</sub> Obtained by MoO<sub>3</sub> Sulfurization

In this paper, we report a multiscale investigation of the compositional, morphological, structural, electrical, and optical emission properties of 2H-MoS<sub>2</sub> obtained by sulfurization at 800 °C of very thin MoO<sub>3</sub> films (with thickness ranging from ~2.8 nm t...

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Bibliographic Details
Main Authors: Salvatore E. Panasci, Antal Koos, Emanuela Schilirò, Salvatore Di Franco, Giuseppe Greco, Patrick Fiorenza, Fabrizio Roccaforte, Simonpietro Agnello, Marco Cannas, Franco M. Gelardi, Attila Sulyok, Miklos Nemeth, Béla Pécz, Filippo Giannazzo
Format: Article
Language:English
Published: MDPI AG 2022-01-01
Series:Nanomaterials
Subjects:
MoS<sub>2</sub>
sulfurization
XPS
Raman
TEM
C-AFM
Online Access:https://www.mdpi.com/2079-4991/12/2/182

Internet

https://www.mdpi.com/2079-4991/12/2/182

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