Dimensionality reduction to improve search time and memory footprint in content-retrieval tasks: Application to semiconductor inspection images
Quality control in semiconductors is a crucial step to produce high quality microchips. During the last years, advances in artificial vision have significantly improved image quality control techniques. In the semiconductor industry, automated visual inspection is fundamental to avoid human interven...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2022-11-01
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| Series: | Advances in Industrial and Manufacturing Engineering |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2666912922000241 |