A Review of Optical Interferometry for High-Precision Length Measurement
Optical interferometry has emerged as a cornerstone technology for high-precision length measurement, offering unparalleled accuracy in various scientific and industrial applications. This review provides a comprehensive overview of the latest advancements in optical interferometry, with a focus on...
| Main Authors: | , , , , , , |
|---|---|
| 格式: | 文件 |
| 语言: | English |
| 出版: |
MDPI AG
2024-12-01
|
| 丛编: | Micromachines |
| 主题: | |
| 在线阅读: | https://www.mdpi.com/2072-666X/16/1/6 |