Time and momentum resolved resonant magnetic x-ray diffraction on EuTe

Time and momentum resolved resonant magnetic x-ray diffraction on EuTe

We used fs- and ps- resonant magnetic x-ray diffraction to probe the laser-induced changes to the magnetic profile in thin films of the antiferromagnetic semicon-ductor EuTe.

Bibliographic Details
Main Authors: Föhlisch A., Holldack K., Springholz G., Kachel T., Weschke E., Schierle E., Trabant C., Pontius N., Schüßler-Langeheine C.
Format: Article
Language:English
Published: EDP Sciences 2013-03-01
Series:EPJ Web of Conferences
Online Access:http://dx.doi.org/10.1051/epjconf/20134103014

Internet

http://dx.doi.org/10.1051/epjconf/20134103014

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