CISSY: A station for preparation and surface/interface analysis of thin film materials and devices
The CISSY end station combines thin film deposition (sputtering, molecular beam epitaxy ambient-pressure methods) with surface and bulk-sensitive analysis (photo emission, x-ray emission, x-ray absorption) in the same UHV system, allowing fast and contamination–free transfer between deposition and a...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Forschungszentrum Jülich
2016-04-01
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| Series: | Journal of large-scale research facilities JLSRF |
| Online Access: | https://jlsrf.org/index.php/lsf/article/view/84 |
| Summary: | The CISSY end station combines thin film deposition (sputtering, molecular beam epitaxy ambient-pressure methods) with surface and bulk-sensitive analysis (photo emission, x-ray emission, x-ray absorption) in the same UHV system, allowing fast and contamination–free transfer between deposition and analysis. It is mainly used for the fabrication and characterization of thin film devices and their components like thin film photovoltaic cells, water-splitting devices and other functional thin film materials. |
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| ISSN: | 2364-091X |