Prognostics and Health Management Using Nonlinear Cumulative Damage Model for Electronic Devices Under Variable Loading

Prognostics and Health Management Using Nonlinear Cumulative Damage Model for Electronic Devices Under Variable Loading

This paper explores nonlinear cumulative damage models applied to Prognostics and Health Management in electronic systems, with a focus on solder joint reliability under variable vibrations. Several cumulative damage models, including the total strain energy density model, are investigated to addres...

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Bibliographic Details
Main Authors: Suyeon Lee, Seungil Park, Changwoon Han
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Access
Subjects:
Cumulative damage model
prognostics and health management
remaining useful life
state-of-damage
total strain energy density model
Online Access:https://ieeexplore.ieee.org/document/10375484/

Internet

https://ieeexplore.ieee.org/document/10375484/

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