Highly efficient and aberration-free off-plane grating spectrometer and monochromator for EUV—soft X-ray applications
Abstract We demonstrate a novel flat-field, dual-optic imaging EUV—soft X-ray spectrometer and monochromator that attains an unprecedented throughput efficiency exceeding 60% by design, along with a superb spectral resolution of λ/Δλ > 200 accomplished without employing variable line spacing grat...
Main Authors: | , , , , , , , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Nature Publishing Group
2024-01-01
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Series: | Light: Science & Applications |
Online Access: | https://doi.org/10.1038/s41377-023-01342-9 |