Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard
This paper evaluates the uncertainty of S-parameter measurements on multilayer printed circuit boards (PCBs) due to the uncertainties of the dimensions and dielectric properties of the line standard in the Thru-Reflect-Line (TRL) calibration. This evaluation is performed in two ways: one is based on...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
The Korean Institute of Electromagnetic Engineering and Science
2021-11-01
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| Series: | Journal of Electromagnetic Engineering and Science |
| Subjects: | |
| Online Access: | http://jees.kr/upload/pdf/jees-2021-5-r-45.pdf |