Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard
This paper evaluates the uncertainty of S-parameter measurements on multilayer printed circuit boards (PCBs) due to the uncertainties of the dimensions and dielectric properties of the line standard in the Thru-Reflect-Line (TRL) calibration. This evaluation is performed in two ways: one is based on...
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| Format: | Article |
| Language: | English |
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The Korean Institute of Electromagnetic Engineering and Science
2021-11-01
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| Series: | Journal of Electromagnetic Engineering and Science |
| Subjects: | |
| Online Access: | http://jees.kr/upload/pdf/jees-2021-5-r-45.pdf |
| _version_ | 1818017437582360576 |
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| author | Hyunji Koo Martin Salter No-Weon Kang Nick Ridler Young-Pyo Hong |
| author_facet | Hyunji Koo Martin Salter No-Weon Kang Nick Ridler Young-Pyo Hong |
| author_sort | Hyunji Koo |
| collection | DOAJ |
| description | This paper evaluates the uncertainty of S-parameter measurements on multilayer printed circuit boards (PCBs) due to the uncertainties of the dimensions and dielectric properties of the line standard in the Thru-Reflect-Line (TRL) calibration. This evaluation is performed in two ways: one is based on repeated TRL calibrations with a randomly perturbed line standard, and the other is based on equations given by Stumper. The two methods require the uncertainties of the S-parameters of the TRL line standard, which are obtained from the uncertainties of the dimensions and dielectric properties using three-dimensional electromagnetic Monte Carlo simulation. The two methods agree well with each other. This study also shows how to apply impedance renormalization in Stumper’s equations. We design the TRL standards and the devices under test (DUTs) in PCB stripline and precisely measure the cross-sectional dimensions of the fabricated striplines. Uncertainty analysis based on the measured values enables us to investigate the impact of realistic deviations in the dimensions of the TRL line standard on the S-parameter measurement uncertainty of the DUTs. Finally, as an example, we evaluated the uncertainty in the measured S-parameters of a Beatty line on the fabricated PCB. |
| first_indexed | 2024-04-14T07:27:08Z |
| format | Article |
| id | doaj.art-20a11f1a672e4d8a976a97e45b0feb13 |
| institution | Directory Open Access Journal |
| issn | 2671-7255 2671-7263 |
| language | English |
| last_indexed | 2024-04-14T07:27:08Z |
| publishDate | 2021-11-01 |
| publisher | The Korean Institute of Electromagnetic Engineering and Science |
| record_format | Article |
| series | Journal of Electromagnetic Engineering and Science |
| spelling | doaj.art-20a11f1a672e4d8a976a97e45b0feb132022-12-22T02:05:58ZengThe Korean Institute of Electromagnetic Engineering and ScienceJournal of Electromagnetic Engineering and Science2671-72552671-72632021-11-0121536937810.26866/jees.2021.5.r.453462Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line StandardHyunji Koo0Martin Salter1No-Weon Kang2Nick Ridler3Young-Pyo Hong4 Center for Electromagnetic Standards, Korea Research Institute of Standards and Science, Daejeon, Korea Electromagnetic and Electrochemical Technologies Department, National Physical Laboratory, Teddington, UK Center for Electromagnetic Standards, Korea Research Institute of Standards and Science, Daejeon, Korea Electromagnetic and Electrochemical Technologies Department, National Physical Laboratory, Teddington, UK Center for Electromagnetic Standards, Korea Research Institute of Standards and Science, Daejeon, KoreaThis paper evaluates the uncertainty of S-parameter measurements on multilayer printed circuit boards (PCBs) due to the uncertainties of the dimensions and dielectric properties of the line standard in the Thru-Reflect-Line (TRL) calibration. This evaluation is performed in two ways: one is based on repeated TRL calibrations with a randomly perturbed line standard, and the other is based on equations given by Stumper. The two methods require the uncertainties of the S-parameters of the TRL line standard, which are obtained from the uncertainties of the dimensions and dielectric properties using three-dimensional electromagnetic Monte Carlo simulation. The two methods agree well with each other. This study also shows how to apply impedance renormalization in Stumper’s equations. We design the TRL standards and the devices under test (DUTs) in PCB stripline and precisely measure the cross-sectional dimensions of the fabricated striplines. Uncertainty analysis based on the measured values enables us to investigate the impact of realistic deviations in the dimensions of the TRL line standard on the S-parameter measurement uncertainty of the DUTs. Finally, as an example, we evaluated the uncertainty in the measured S-parameters of a Beatty line on the fabricated PCB.http://jees.kr/upload/pdf/jees-2021-5-r-45.pdfcharacteristic impedanceimpedance renormalizationline standardmonte carloprinted circuit board (pcb)-parameter uncertaintystriplinetrl calibration |
| spellingShingle | Hyunji Koo Martin Salter No-Weon Kang Nick Ridler Young-Pyo Hong Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard Journal of Electromagnetic Engineering and Science characteristic impedance impedance renormalization line standard monte carlo printed circuit board (pcb) -parameter uncertainty stripline trl calibration |
| title | Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard |
| title_full | Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard |
| title_fullStr | Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard |
| title_full_unstemmed | Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard |
| title_short | Uncertainty of -Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard |
| title_sort | uncertainty of parameter measurements on pcbs due to imperfections in the trl line standard |
| topic | characteristic impedance impedance renormalization line standard monte carlo printed circuit board (pcb) -parameter uncertainty stripline trl calibration |
| url | http://jees.kr/upload/pdf/jees-2021-5-r-45.pdf |
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