A Proposition to Correct Infrared Emissivity Measurements for Curved Surface Targets Based on the Irradiation Reflection Method
In this paper, a measurement correction method is proposed to correct the error of the irradiation reflection method when measuring the emissivity of curved surface targets. First, by introducing an angle parameter related to the target surface shape, the formulas of emissivity measurements for curv...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-10-01
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Series: | Photonics |
Subjects: | |
Online Access: | https://www.mdpi.com/2304-6732/9/10/739 |