Detection of Fusarium Head Blight in Wheat Ears Using Continuous Wavelet Analysis and PSO-SVM

Detection of Fusarium Head Blight in Wheat Ears Using Continuous Wavelet Analysis and PSO-SVM

Fusarium head blight, caused by a fungus, can cause quality deterioration and severe yield loss in wheat. It produces highly toxic deoxynivalenol, which is harmful to human and animal health. In order to quickly and accurately detect the severity of fusarium head blight, a method of detecting the di...

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Bibliographic Details
Main Authors: Linsheng Huang, Kang Wu, Wenjiang Huang, Yingying Dong, Huiqin Ma, Yong Liu, Linyi Liu
Format: Article
Language:English
Published: MDPI AG 2021-10-01
Series:Agriculture
Subjects:
fusarium head blight
hyperspectral
continuous wavelet analysis
support vector machine
particle swarm optimization
Online Access:https://www.mdpi.com/2077-0472/11/10/998

Internet

https://www.mdpi.com/2077-0472/11/10/998

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