Development of a seedling inoculation technique for rapid evaluation of soybean for resistance to Phomopsis longicolla under controlled conditions

Development of a seedling inoculation technique for rapid evaluation of soybean for resistance to Phomopsis longicolla under controlled conditions

Abstract Background Phomopsis seed decay (PSD) of soybean (Glycine max L. Merr.) is caused primarily by the seed-borne fungal pathogen Phomopsis longicolla T. W. Hobbs. The PSD disease reduces seed quality and yield worldwide. Development of effective techniques to evaluate soybean for resistance to...

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Bibliographic Details
Main Author: Shuxian Li
Format: Article
Language:English
Published: BMC 2018-09-01
Series:Plant Methods
Subjects:
Soybean
Phomopsis longicolla
Phomopsis seed decay
Seedling inoculation
Resistance
Online Access:http://link.springer.com/article/10.1186/s13007-018-0348-x

Internet

http://link.springer.com/article/10.1186/s13007-018-0348-x

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