Mineral Characterization Using Scanning Electron Microscopy (SEM): A Review of the Fundamentals, Advancements, and Research Directions

Mineral Characterization Using Scanning Electron Microscopy (SEM): A Review of the Fundamentals, Advancements, and Research Directions

Scanning electron microscopy (SEM) is a powerful tool in the domains of materials science, mining, and geology owing to its enormous potential to provide unique insight into micro and nanoscale worlds. This comprehensive review discusses the background development of SEM, basic SEM operation, includ...

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Bibliographic Details
Main Authors: Asif Ali, Ning Zhang, Rafael M. Santos
Format: Article
Language:English
Published: MDPI AG 2023-11-01
Series:Applied Sciences
Subjects:
scanning electron microscopy
minerals
artificial intelligence
machine learning
energy-dispersive spectrometer
backscattered electron imaging
Online Access:https://www.mdpi.com/2076-3417/13/23/12600

Internet

https://www.mdpi.com/2076-3417/13/23/12600

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