Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model

Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model

A modified Prandtl–Ishlinskii (PI) model, referred to as a direct inverse asymmetric PI (DIAPI) model in this paper, was implemented to reduce the displacement error between a predicted model and the actual trajectory of a piezoelectric actuator which is commonly found in AFM systems. Due to the non...

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Bibliographic Details
Main Authors: Dong Wang, Peng Yu, Feifei Wang, Ho-Yin Chan, Lei Zhou, Zaili Dong, Lianqing Liu, Wen Jung Li
Format: Article
Language:English
Published: MDPI AG 2015-02-01
Series:Sensors
Subjects:
atomic force microscope
hysteresis
piezoelectric actuator
direct inverse asymmetric PI model
feedforward control
Online Access:http://www.mdpi.com/1424-8220/15/2/3409

Internet

http://www.mdpi.com/1424-8220/15/2/3409

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