Reliability Evaluation and Improvement of Islanded Microgrid Considering Operation Failures of Power Electronic Equipment

With the high integration of power electronic technologies in microgrids, the reliability assessment considering power electronic devices has become a hot topic. However, so far no research has considered the impact of the operation failure probability of power electronic equipment on the overall re...

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Bibliographic Details
Main Authors: Wen Zhong, Lingfeng Wang, Zhaoxi Liu, Shiying Hou
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:Journal of Modern Power Systems and Clean Energy
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8846890/