Impact of Bias Temperature Instabilities on the Performance of Logic Inverter Circuits Using Different SiC Transistor Technologies
All electronic devices, in this case, SiC MOS transistors, are exposed to aging mechanisms and variability issues, that can affect the performance and stable operation of circuits. To describe the behavior of the devices for circuit simulations, physical models which capture the degradation of the d...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-09-01
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| Series: | Crystals |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-4352/11/9/1150 |