Wavelet-based information theory in quantitative assessment of AFM images’ quality

Abstract The quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon’s application of information theory for measuring image quality. Specifically, we propose quantifying the loss of image informa...

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Bibliographic Details
Main Authors: Bartosz Czesław Pruchnik, Piotr Adam Putek, Teodor Paweł Gotszalk
Format: Article
Language:English
Published: Nature Portfolio 2024-02-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-024-53846-y