In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes

In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes

Long slender piezoresistive silicon microprobes are a new type of sensor for measurement of surface roughness. Their advantage is the ability to measure at speeds of up to 15 mm/s, which is much faster than conventional stylus probes. The drawbacks are their small measurement range and tendency to b...

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Bibliographic Details
Main Authors: Linus Teir, Tuomas Lindstedt, Thomas Widmaier, Björn Hemming, Uwe Brand, Michael Fahrbach, Erwin Peiner, Antti Lassila
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Sensors
Subjects:
silicon microprobe
high speed
roughness
paper machine roll
metrology
Online Access:https://www.mdpi.com/1424-8220/21/17/5955

Internet

https://www.mdpi.com/1424-8220/21/17/5955

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